Showing results: 211 - 225 of 230 items found.
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E8267D -
Keysight Technologies
Test advanced receivers with realistic wideband radar, EW and Satcom waveforms with metrology-grade performance and versatile capabilitiesSimulate complex electromagnetic environments with up to 4 GHz of bandwidthReduce the time you spend creating complex signals with Signal Studio software: pulse building, noise power ratio (NPR), multi-tone signals, wireless & moreMaster your most complex signal requirements with the industry's best SSB phase noise: 143 dBc/Hz at 1 GHz (10 kHz offset)
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Shanghai MCP Corp
Respective dual channels function/arbitrary waveform generator. Sine wave output up to 160MHz, full-band resolution of 1μHz. Pulse waveform up to 50MHz (or 40MHz), adjustable time of rising, falling and duty ratio. Sampling rate of 500MSa/s and vertical resolution of 16bit. 6-bit high-precision frequency meter compatible with TTL level signal. Arbitrary wave storage of 8~32M points, 7GB non-volatile waveform storage. Multi modulation function::AM,FM,PM, ASK,FSK,PSK, BPSK, QPSK,OSK,PWM, QAM, SUM . 16bit digital arbitrary wave (TTL level) DARB. 16th Harmonic Generation Function. Protocol output: I2C, SPI, UART (TTL level). 8 Inch high-resolution TFT color LCD,WVGA(800×480). Standard interface: USB Host, USB Device, LAN, 10MHz clock source input/output. Frequency sweep and burst output. Easy-to-use multi-functional knob and numeric keypad
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KES7400A -
Kikusui Electronics Corp.
The KES7400A Series comes in a single cabinet that consists of a Signal Generator module (including an arbitrary pulse generator), which combines our power supply technology and EMC technology, and a high-speed bipolar power supply module. Many automotive electronic devices have long wire harnesses and inductive load characteristics, as do motors, or capacitive load characteristics with a large-capacity capacitor connected between the input and ground. In the case of these devices, general DC power supplies exceed the linear operation range, potentially making it impossible to obtain the desired waveform output.
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AI-5120 -
Advent Instruments Inc.
The AI-5120 is a compact device designed for monitoring and analyzing signals present on the telephone line. By sensing the voltage present on the telephone line it detects and measures ringing, DTMF & pulse dialing, FSK (Bell 202 and V.23) signals, line polarity reversals, and open switching intervals (OSI). Working in conjunction with the TRsSim software on a PC, the AI-5120 becomes a valuable tool in analyzing and debugging Caller ID and SMS (Short Message Service) data transmission. Like an oscilloscope, it can capture and display waveforms showing various signals present on the telephone line.
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MAC-21 -
ETI Precision
The MAC-21 uses proven microprocessor and A/D converter technology to provide real-time waveform analysis. This ensures accurate true-RMS readings of current pulses, even with DC offset and distortion, which are typical in primary injection testing. Intelligent threshold algorithms provide accurate trip time measurement. Integration of measurement and control functions allow advanced features such as preset on times, auto ranging, and optional printer or computer interface.
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4012 -
Barth Electronics, Inc
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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M+P International
Shock testing simulates an extreme event that a unit under test is exposed to during handling, shipment, explosive event and/or daily use (e.g. dropping an object). The profile for this type of testing is defined by the shape of the time domain waveform together with its amplitude and duration. The m+p VibControl vibration control system offers full functionality for classical shock and shock response spectrum testing as well as for tests using external pulses or the capture of transient signals.
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SHF Communication Technologies AG
SHF’s Bit Pattern Generators (BPG) or Pulse Pattern Generators (PPG), Error Analyzers (EA) and remote heads form a Bit Error Ratio Tester (BERT) suite, which supports a vast number of different applications including high speed Ethernet rates like 100GbE, 200GbE, 400GbE and 1TbE. When it comes to signal generation an Arbitrary Waveform Generator (AWG) is the all-in-one device suitable for every purpose in Telecommunication, Optics, Medicine, Radar, Physics or even Quantum Computing.
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SDG7000A -
SIGLENT Technologies
SIGLENT’s SDG7000A is a family of dual-channel Arbitrary Waveform Generators that feature up to 1 GHz bandwidth, a maximum sample rate of 5 GSa/s, and 14-bit vertical resolution. It can generate arbitrary waveforms point by point with a maximum 2.5 GSa/s sample rate and vector signals with a maximum of 500 MSa/s. It also has the ability to generate a variety of signals such as continuous wave, Pulse, Noise, PRBS patterns, and a 16-bit digital bus. It supports the generation of complex signals such as modulation, sweeping, bursting, and dual-channel copying/coupling/tracking and superposition. The outputs are user selectable for differential or single-ended connections and support a maximum output range of ± 24 V. The instrument can ensure a large amplitude under high-frequency which eliminates an external power amplifier in some applications and addresses a wider range of requirements.
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ESDEMC Technology LLC
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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HBM-TS10-A -
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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HBM-VT -
High Power Pulse Instruments GmbH
- HBM pulse generator verification tester according ANSI/ESDA/JEDEC JS-001 up to ±10kV- To be used in HBM test and qualification labs for regular pulse generator specification compliance test in order to fulfill lab audit and certification requirements- Fully automatic compliance test and verification of HBM pulse generators regarding ANSI/ESDA/JEDEC JS-001 normative standard at 3 different load conditions: Short Circuit, 500 Ω, and a reference diode at VBR=15 V reverse breakdown voltage, including DC test- Parameter evaluation and verification of the transient HBM current waveforms: Peak Current, Rise Time, Decay Time, Maximum Ringing Current- Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, 8010C, HBM-TS10-A hardware systems in combination with HBM-S1-B (6kV) pulse generators (upgrade on request)- Fully automatic test report generation (PDF)- Electrically floating (no fixed system ground): The HBM loads, current sensor output, USB control interface and the enclosure are electrically floating. There is no limiting system ground which may introduce common-mode interference induced HBM current measurement errors.- Isolated industrial full-speed USB control interface- Isolated power supply derived from USB port- Compact size 126mm x 82.5mm x 44.5mm
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875 -
Berkeley Nucleonics Corporation
The Model 875 is an ultra-fast-switching vector-modulated signal source covering a continuous frequency range from 10 MHz to 40 GHz. The Model 875 offers switching speeds as fast as to 200ns, enables ultrafast CW frequency sweeps, chirping, intra-pulse modulation and pulse shaping, all with very low phase noise. A high-performance internal I/Q modulator enables customized modulation waveforms and supports dedicated modulation schemes such as avionics modulations. This newly engineered design couples extremely deep memory and wideband capabilities - making complex modulation affordable and easy to program.
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C&C Instruments Co.
Waveform : Sine, Triangle, Square, Pulse, Sawtooth, Ramp 0.2Hz-150MHz EXT Frequency Counter(Option : 1:6 GHz or 2.7GHz) Self made insert ASIC Function : Total, RPM, Period, LPF, COUPL(AC/DC), ATT(X10) Fast,High-Resolution, 8Digits LED display Internal or External AM,FM Modulation Internal or External Burst and Linear Sweep Countrol from 1 : 1 to 100:1 TTL/CMOS Leveled Square Wave Output Maximum Attenuation of 20 dB cna be obtained Output impedance : 50 INPUT SENSITMTYKHz Range : 100mVms, MHz Range : 300mVms SWEEP WIDTH : Variable from 1:1 -100:1 RATE : 0.5Hz - 50Hz(20ms-2s) INTERNAL : Linear Bilt-in 5digits Green LED display
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Guzik Technical Enterprises
Besides the primary WITE32 Test Environment package at the heart of our spinstand-based test systems, Guzik offers a variety of software options to provide additional measurement accuracy and analysis. Control and Automation software enhances various electro-mechanical capabilities of the test system (such as servo accuracy), and the available suite of Analysis software tools provides deep insight into the drive component under evaluation. Adjacent Track Interference, 3D Pulse Profile, Media Scanning and Bit Error Rate are examples of some of the optional additions. Some software tools require the WDM5000 Waveform Digitizer to be part of the overall test system.
